Verma, Yogesh Kumar, and Santosh Kumar Gupta. “Reliability Analysis of SiGe Heterojuncion Bipolar Transistor”. Asian Journal For Convergence In Technology (AJCT) ISSN -2350-1146 4, no. I (April 15, 2018). Accessed January 31, 2026. http://asianssr.org/index.php/ajct/article/view/584.