FPGA Based Characterization of Thin Film For Guided Mode Resonance Devices Utilizing Layer-By-Layer Deposition of Nano-Particles

  • Shekhar Suman Borah
Keywords: FPGA, Fabry-Perot interferometer, thin-film


Optical sensors are extensively used in different fields of engineering. Multilayer thin film manufactured utilizing the Layer-by-Layer self-assembly method has obtained many applications such as mass sensors, smoke sensors, ammonia gas sensors, membranes. At the time of synthesis, in-situ monitoring of film growth, as well as precise control of film thickness, are of excellent significance for various applications. The deposition rate and film density are two of the various parameters that determine the nature of the accumulated film. On-line monitoring of thin-film thickness has been enhanced as an inherent part for thin-film formation with wanted features. This works aims to develop a convenient simulation method to determine the thickness of the film based upon optical signal processing using FPGA and Verilog HDL.


[1].Tibuleac, S., Magnusson, R., Malonado, T. A., and Zuffada, C., 1997, "Direct and inverse techniques of guided-mode resonance filters designs," IEEE Antennas and Propagation Society International Symposium, Digest, Montreal, QC, Canada, pp. 2380-2383 vol.4, doi: 10.1109/APS.1997.625449.
[2] Karim, F., Bora, T., Chaudhari, M. B., Habib, K., Mohammed, W. S., Dutta, J., 2013, “Optical Fiber Based Sensor for In Situ Monitoring of Cadmium Sulfide Thin Film Growth” , vol. 38, No. 24, OPTICS LETTERS, Optical Society of America.
[3] Kotov, N. A., Dekany, I., Fendler, J. H., 1995, “Layer-by-Layer Self-Assembly of Polyelectrolyte-Semiconductor Nanoparticle Composite Films” he Journal of Physical Chemistry, 99(35), pp. 13065-13069, DOI: 10.1021/j100035a005 2012.
[4] Brown, S., Vranesic, Z., 2008, “Fundamentals of Digital logic with Verilog Design”, 2nd ed., vol. 3 : McGraw-Hill.
[5] Haskell, R. E., Hanna, D. M., “Digital Design using digilent FPGA Boards”, Verilog/ Active-HDL Edition, LBE Books.
How to Cite
Borah, S. S. (2021). FPGA Based Characterization of Thin Film For Guided Mode Resonance Devices Utilizing Layer-By-Layer Deposition of Nano-Particles. Asian Journal For Convergence In Technology (AJCT) ISSN -2350-1146, 7(1), 99-101. https://doi.org/10.33130/AJCT.2021v07i01.021

Most read articles by the same author(s)

Obs.: This plugin requires at least one statistics/report plugin to be enabled. If your statistics plugins provide more than one metric then please also select a main metric on the admin's site settings page and/or on the journal manager's settings pages.